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"Introduction to White Light Interferometry"

How white light interferometry works, where it’s used, and the tools behind it

This document introduces the principles of white light interferometry (WLI), a non-contact method for achieving nanometer-level 3D measurements. It details how interference from a broadband light source generates high-accuracy height data independent of magnification, making it ideal for demanding surface metrology applications in research, development, and quality control.

Principle of Operation: Learn how interference fringes are analyzed to generate 3D surface data with nanometer-level resolution.

System Comparison: Evaluate the advantages of WLI in accuracy and non-destructive analysis against other technologies, including laser confocal, focus variation, and contact profilometers.

Application & Suitability: Discover ideal uses, from semiconductor wafers to transparent films, and learn how to address challenging targets like low-reflectivity or steep-angled surfaces.

This guide provides the essential knowledge to determine if WLI is the right solution for your high-precision measurement needs.

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